"A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid ..."

Richard M. Sedmak, John Evans (1995)

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DOI: 10.1109/TEST.1995.529856

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Richard M. Sedmak, John Evans:
A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). ITC 1995: 319-327

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