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"Efficiently Performing Yield Enhancements by Identifying Dominant Physical ..."

Manish Sharma et al. (2008)

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DOI: 10.1109/TEST.2008.4700589

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/SharmaBLALKTCTCLM08
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SharmaBLALKTCTCLM08
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9

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