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"Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault ..."

John Paul Shen, F. Joel Ferguson (1988)

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DOI: 10.1109/TEST.1988.207759

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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John Paul Shen, F. Joel Ferguson:
Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis. ITC 1988: 475-484

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