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"Zero defects or zero stuck-at faults-CMOS IC process improvement with ..."
Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins (1990)
- Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. ITC 1990: 255-256
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