"Scan Test for 99% Defect Coverage of R-2R DACs."

Stephen Sunter, Krzysztof Jurga (2025)

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DOI: 10.1109/ITC58126.2025.00006

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Stephen Sunter, Krzysztof Jurga:
Scan Test for 99% Defect Coverage of R-2R DACs. ITC 2025: 11-18

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