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"Outlier detection for single particle analysis in Electron Microscopy."
Carlos Oscar Sánchez Sorzano et al. (2014)
- Carlos Oscar Sánchez Sorzano, Javier Vargas, José Miguel de la Rosa-Trevín, Airen Zaldívar-Peraza, Joaquín Otón, Vahid Abrishami, Ignacio Foche, Roberto Marabini, Gabriel Caffarena, José María Carazo:
Outlier detection for single particle analysis in Electron Microscopy. IWBBIO 2014: 950-959
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