"A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime."

Thiago Santos Copetti, Supriya Chakraborty, Letícia Maria Bolzani Poehls (2025)

Details and statistics

DOI: 10.1109/LATS65346.2025.10963957

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-12