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"A novel Pattern Selection Algorithm to reduce the Test Cost of large ..."

Giusy Iaria et al. (2022)

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DOI: 10.1109/LATS57337.2022.9936975

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-01

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  dblp key:
  - conf/latw/IariaABRAGT22
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  - https://dblp.org/rec/conf/latw/IariaABRAGT22
Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS 2022: 1-6

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