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"Technique based on On-Chip Current Sensors and Neighbourhood Comparison ..."
Felipe Lavratti et al. (2013)
- Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii:
Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. LATW 2013: 1-6
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