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"Impact of increasing the fin height on soft error rate and static noise ..."
Hector Villacorta et al. (2015)
- Hector Villacorta, Roberto Gómez, Sebastià A. Bota, Jaume Segura
, Víctor H. Champac:
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell. LATS 2015: 1-6
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