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"Resilient Subclass Discriminant Analysis with Application to Prelens Tear ..."

Kim L. Boyer, Dijia Wu (2011)

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DOI: 10.1007/978-3-642-21587-2_1

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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  dblp key:
  - conf/mcpr2/BoyerW11
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  - https://dblp.org/rec/conf/mcpr2/BoyerW11
Kim L. Boyer, Dijia Wu:
Resilient Subclass Discriminant Analysis with Application to Prelens Tear Film Interferometry. MCPR 2011: 1-11

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