"Infrared protection system for high-voltage testing of SiC and GaN FETs ..."

Filip Hormot, Josip Bacmaga, Adrijan Baric (2016)

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DOI: 10.1109/MIPRO.2016.7522113

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Filip Hormot, Josip Bacmaga, Adrijan Baric:
Infrared protection system for high-voltage testing of SiC and GaN FETs used in DC-DC converters. MIPRO 2016: 72-75

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