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"Variability robustness enhancement for 7nm FinFET 3T1D-DRAM cells."

Esteve Amat et al. (2013)

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DOI: 10.1109/MWSCAS.2013.6674590

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-06

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Esteve Amat, Carmen G. Almudéver, Nivard Aymerich, Antonio Rubio, Ramon Canal:
Variability robustness enhancement for 7nm FinFET 3T1D-DRAM cells. MWSCAS 2013: 81-84

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