"A Scan Chain Based SEU Test Method for Microprocessors."

Yaqing Chi et al. (2013)

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DOI: 10.1007/978-3-642-41635-4_19

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-27

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  - conf/nccet/ChiHLH13
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Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu:
A Scan Chain Based SEU Test Method for Microprocessors. NCCET 2013: 180-185

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