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"An Efficient Model for Soft Error Vulnerability of Dynamic Circuits."

Yan Sun et al. (2017)

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DOI: 10.1007/978-981-10-7844-6_13

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-29

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  dblp key:
  - conf/nccet/SunCLL17
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  persistent URL:
  - https://dblp.org/rec/conf/nccet/SunCLL17
Yan Sun, Yuesheng Cao, Jinwen Li, Tiejun Li:
An Efficient Model for Soft Error Vulnerability of Dynamic Circuits. NCCET 2017: 133-142

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