"Scanning electron beam induced deposition for conductive tip modification."

P. L. Chen et al. (2012)

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DOI: 10.1109/NEMS.2012.6196836

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-08

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P. L. Chen, James Su, M. H. Shiao, M. N. Chang, C. H. Lee, Chee Wee Liu:
Scanning electron beam induced deposition for conductive tip modification. NEMS 2012: 553-556

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