"A Parallel Algorithm for VLSI Test Generation."

Muralidhar Medidi, Assim Sagahyroon (1995)

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type: Conference or Workshop Paper

metadata version: 2020-03-24

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Muralidhar Medidi, Assim Sagahyroon:
A Parallel Algorithm for VLSI Test Generation. Parallel and Distributed Computing and Systems 1995: 280-282

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