"A Method of Gate-Level Circuit Reliability Estimation Based on Iterative ..."

Jie Xiao et al. (2011)

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DOI: 10.1109/PRDC.2011.45

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jie Xiao, Jianhui Jiang, Xuguang Zhu, Chengtian Ouyang:
A Method of Gate-Level Circuit Reliability Estimation Based on Iterative PTM Model. PRDC 2011: 276-277

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