"MC/DC Test Case Automatic Generation for Safety-Critical Systems."

Cong Wang et al. (2022)

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DOI: 10.1109/QRS57517.2022.00079

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-28

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Cong Wang, Haiying Sun, Hui Dou, HongTao Chen, Jing Liu:
MC/DC Test Case Automatic Generation for Safety-Critical Systems. QRS 2022: 732-743

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