Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local ..."

Ushik Shrestha Khwakhali et al. (2022)

> Home

Details and statistics

DOI: 10.1109/RIVF55975.2022.10013920

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/rivf/KhwakhaliTTKTH22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/rivf/KhwakhaliTTKTH22
Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, Truong Duc Khai, Chung Quan Tin, Loh Ing Hoe:
Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern. RIVF 2022: 226-231

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.