"Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining ..."

Tong Ru et al. (2025)

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DOI: 10.1109/ROBIO66223.2025.11376108

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type: Conference or Workshop Paper

metadata version: 2026-03-05

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Tong Ru, Hao Li, Yihui Li, Jianwen Wu, Chao Liu, Ruiqiang Lu, Zhiming Liang, Yongjie Chen, Zheng Wu, Bingfeng Li, Junjie Li:
Hierarchical X-Ray Recognition for Obsolete Semiconductor Chips Combining Rule-Driven and Deep Learning Approaches. ROBIO 2025: 936-941

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