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"Constrained detecting arrays for fault localization in combinatorial testing."

Hao Jin, Ce Shi, Tatsuhiro Tsuchiya (2020)

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DOI: 10.1145/3341105.3373952

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/sac/JinST20
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Hao Jin, Ce Shi, Tatsuhiro Tsuchiya:
Constrained detecting arrays for fault localization in combinatorial testing. SAC 2020: 1971-1978

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