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"Twin logic gates: improved logic reliability by redundancy concerning gate ..."

Hagen Sämrow et al. (2009)

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DOI: 10.1145/1601896.1601960

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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  - conf/sbcci/SamrowCSTT09
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Hagen Sämrow, Claas Cornelius, Frank Sill, Andreas Tockhorn, Dirk Timmermann:
Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown. SBCCI 2009

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