"Is the Number of Faults Helpful for Cross-Company Defect Prediction?"

Yiyang Jing, Jiansheng Zhang, Jin Liu (2017)

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DOI: 10.18293/SEKE2017-034

access: open

type: Conference or Workshop Paper

metadata version: 2021-02-03

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  - conf/seke/JingZL17
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  - https://dblp.org/rec/conf/seke/JingZL17
Yiyang Jing, Jiansheng Zhang, Jin Liu:
Is the Number of Faults Helpful for Cross-Company Defect Prediction? SEKE 2017: 111-116

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