"Signal processing techniques for reliability improvement of sub-20NM NAND ..."

Dong-hwan Lee, Jonghong Kim, Wonyong Sung (2013)

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DOI: 10.1109/SIPS.2013.6674526

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Dong-hwan Lee, Jonghong Kim, Wonyong Sung:
Signal processing techniques for reliability improvement of sub-20NM NAND flash memory. SiPS 2013: 318-323

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