"DSK-YOLO: Feature-level Super Resolution Boosted Industrial Defect Detection."

Meichen Mu et al. (2025)

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DOI: 10.1109/SMC58881.2025.11343713

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-11

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Meichen Mu, Meiqin Liu, Senlin Zhang, Shaoyi Du:
DSK-YOLO: Feature-level Super Resolution Boosted Industrial Defect Detection. SMC 2025: 722-727

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