default search action
"Zero-Aware Fine-Grained Power Gating for Standard-Cell Memories in ..."
Jun Shiomi et al. (2022)
- Jun Shiomi, Shogo Terada, Tohru Ishihara, Hidetoshi Onodera:
Zero-Aware Fine-Grained Power Gating for Standard-Cell Memories in Voltage-Scaled Circuits. SOCC 2022: 1-6
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.