"Up-to Techniques for Branching Bisimilarity."

Rick Erkens, Jurriaan Rot, Bas Luttik (2020)

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DOI: 10.1007/978-3-030-38919-2_24

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-21

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Rick Erkens, Jurriaan Rot, Bas Luttik:
Up-to Techniques for Branching Bisimilarity. SOFSEM 2020: 285-297

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