"Statistical Multiframes Accuracy Methodology For Attendance Marking System."

Kuan Heng Lee et al. (2019)

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DOI: 10.1109/TAAI48200.2019.8959936

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-04

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Kuan Heng Lee, Sanjay V. Addicam, Ilya Krylov, Sergei Nosov, Mee Sim Lai, Zhan Qiang Lee, Chung Shien Chai:
Statistical Multiframes Accuracy Methodology For Attendance Marking System. TAAI 2019: 1-5

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