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"Selection Criteria of Device under Test and Their Impact on Learning ..."

Daniel H. Y. Teng (2020)

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DOI: 10.1109/TALE48869.2020.9368368

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-25

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Daniel H. Y. Teng:
Selection Criteria of Device under Test and Their Impact on Learning Outcomes of Functional Verification. TALE 2020: 692-697

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