"Exploit both SMART Attributes and NAND Flash Wear Characteristics to ..."

Yunfei Gu, Chentao Wu, Xubin He (2024)

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type: Conference or Workshop Paper

metadata version: 2024-07-16

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Yunfei Gu, Chentao Wu, Xubin He:
Exploit both SMART Attributes and NAND Flash Wear Characteristics to Effectively Forecast SSD-based Storage Failures in Clusters. USENIX ATC 2024: 1101-1117

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