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"Skip-scan: A methodology for test time reduction."

Binod Kumar et al. (2016)

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DOI: 10.1109/ISVDAT.2016.8064869

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/vdat/0001NPT16
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  - https://dblp.org/rec/conf/vdat/0001NPT16
Binod Kumar, Boda Nehru, Brajesh Pandey, Jaynarayan T. Tudu:
Skip-scan: A methodology for test time reduction. VDAT 2016: 1-6

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