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"Electro-Thermal Analysis of Vertically Stacked Gate All Around Nano-sheet ..."

Arvind Bisht, Yogendra Pratap Pundir, Pankaj Kumar Pal (2022)

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DOI: 10.1007/978-3-031-21514-8_12

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-25

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Arvind Bisht, Yogendra Pratap Pundir, Pankaj Kumar Pal:
Electro-Thermal Analysis of Vertically Stacked Gate All Around Nano-sheet Transistor. VDAT 2022: 126-136

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