"Multi-mode Toggle Random Access Scan to Minimize Test Application Time."

Anshu Goel, Rohini Gulve (2017)

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DOI: 10.1007/978-981-10-7470-7_21

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-06

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Anshu Goel, Rohini Gulve:
Multi-mode Toggle Random Access Scan to Minimize Test Application Time. VDAT 2017: 205-216

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