"Industrial Visual Defect Inspection of Electronic Components with Siamese ..."

Warley Barbosa et al. (2023)

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DOI: 10.5220/0011696400003417

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Warley Barbosa, Lucas Amaral, Tiago F. Vieira, Bruno Georgevich Ferreira, Gustavo Melo:
Industrial Visual Defect Inspection of Electronic Components with Siamese Neural Network. VISIGRAPP (4: VISAPP) 2023: 889-896

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