"Enhancing the efficiency and accuracy of cell-aware testing to reach zero ..."

Harry H. Chen (2017)

> Home

Details and statistics

DOI: 10.1109/VLSI-DAT.2017.7939645

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi-dat/Chen17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi-dat/Chen17
Harry H. Chen:
Enhancing the efficiency and accuracy of cell-aware testing to reach zero defects. VLSI-DAT 2017: 1

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.