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"Test for more than pass/fail using on-chip temperature sensor."
Chih-Wea Wang et al. (2012)
- Chih-Wea Wang, Chen-Tung Lin, Chun-Chieh Hsu, Ching-Tung Wu, Chi-Feng Wu:
Test for more than pass/fail using on-chip temperature sensor. VLSI-DAT 2012: 1-4
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