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"Improving IJTAG Test Efficiency and Security."

Sying-Jyan Wang et al. (2022)

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DOI: 10.1109/VLSI-DAT54769.2022.9768048

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  dblp key:
  - conf/vlsi-dat/WangSLLC22
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  - https://dblp.org/rec/conf/vlsi-dat/WangSLLC22
Sying-Jyan Wang, Yen-Chang Shih, Katherine Shu-Min Li, Chen-Yeh Lin, Song-Kong Chong:
Improving IJTAG Test Efficiency and Security. VLSI-DAT 2022: 1-4

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