"VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG ..."

Youngsoo Shin et al. (2016)

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DOI: 10.1007/978-3-319-46097-0

access: closed

type: Editorship

metadata version: 2019-10-22

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Youngsoo Shin, Chi-Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis:
VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers. IFIP Advances in Information and Communication Technology 483, Springer 2016, ISBN 978-3-319-46096-3 [contents]

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