"The Demand and Practical Approach for 100x Test Compression."

Ron Press, Jay Jahangiri (2006)

> Home

Details and statistics

DOI: 10.1109/VLSISOC.2006.313241

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/PressJ06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/PressJ06
Ron Press, Jay Jahangiri:
The Demand and Practical Approach for 100x Test Compression. VLSI-SoC 2006: 245-250

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.