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"Challenges for high-density 16Gb ReRAM with 27nm technology."
Scott Sills et al. (2015)
- Scott Sills, Shuichiro Yasuda, Alessandro Calderoni, Christopher Cardon, Jonathan Strand, Katsuhisa Aratani, Nirmal Ramaswamy:
Challenges for high-density 16Gb ReRAM with 27nm technology. VLSIC 2015: 106-
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