"Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling ..."

Deepak Baranwal et al. (2015)

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DOI: 10.1109/VLSID.2015.97

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Deepak Baranwal, Digvijay Singh, Khanusiya Soyeb, Sidhartha Sankar Rout, Sujay Deb:
Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring. VLSID 2015: 541-546

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