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"A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers."

Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das (2001)

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DOI: 10.1109/ICVD.2001.902691

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/HuangJD01a
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das:
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers. VLSI Design 2001: 397-402

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