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"Automatic Test Plan Generation for Analog Integrated Circuits - A ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ravindranath Naiknaware et al. (1993)

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DOI: 10.1109/ICVD.1993.669665

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
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Ravindranath Naiknaware, G. N. Nandakumar, Rajeev Arora, John Larkin:
Automatic Test Plan Generation for Analog Integrated Circuits - A Practical Approach. VLSI Design 1993: 140-143

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