"A Delay Test to Differentiate Resistive Interconnect Faults from Weak ..."

Haihua Yan, Adit D. Singh (2005)

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DOI: 10.1109/ICVD.2005.9

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Haihua Yan, Adit D. Singh:
A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects. VLSI Design 2005: 47-52

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