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"Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting ..."

Turgut Oktem, Dirk T. M. Slock (2011)

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DOI: 10.1109/VETECS.2011.5956780

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Turgut Oktem, Dirk T. M. Slock:
Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting Based Localization. VTC Spring 2011: 1-5

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