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"Enabling Embedded Memory Diagnosis via Test Response Compression."

John T. Chen et al. (2001)

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DOI: 10.1109/VTS.2001.923452

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ChenMRKK01
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ChenMRKK01
John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare:
Enabling Embedded Memory Diagnosis via Test Response Compression. VTS 2001: 292-298

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