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"Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a ..."
Robert Madge et al. (2002)
- Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74
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