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"Signal Integrity Problems in Deep Submicron Arising from Interconnects ..."
Petra Nordholz et al. (1998)
- Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams:
Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. VTS 1998: 28-33
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