"Parallel Loopback Test of Mixed-Signal Circuits."

Joonsung Park, Hongjoong Shin, Jacob A. Abraham (2008)

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DOI: 10.1109/VTS.2008.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Parallel Loopback Test of Mixed-Signal Circuits. VTS 2008: 309-316

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